Thickness measurement - Optical sensor 'CHRocodile 2DW series'
Use an appropriate light source wavelength for doped wafers to accommodate challenging doped wafer thickness measurements.
The "CHRocodile 2DW Series" is a device that can non-contact measure the thickness of materials such as wafers and coatings. It is capable of measuring doped wafers and can be applied in-line, with a proven track record among many customers. In addition to measuring the thickness of semiconductor wafers like sapphire, Si, and SiC, it can also measure the thickness of films, resins, glass, and solar cells. It supports interference film thickness of up to 16 layers. 【Features】 ■ Wide range of thickness measurement, compatible with various materials With a rich lineup of probes, it covers thickness from thin films (a few micrometers) to thick films (780 micrometers). It supports doped wafers. ■ High resolution (sub-micron, minimum 1nm) ■ Contributes to reducing development costs and shortening development lead times, with a software development kit (DLL, etc.) available for device integration ■ Extensive track record in the semiconductor industry *For more details, please refer to the documentation. Feel free to contact us with any inquiries.
- Company：プレシテック・ジャパン
- Price：Other
